X-Ray Diffraction

X-ray Diffraction (XRD) is a powerful non-destructive technique used to analyze the atomic and crystalline structure of materials. By directing X-rays at a sample, XRD measures the diffraction patterns created when X-rays scatter off the material’s atomic planes, following Bragg’s Law. The resulting diffraction pattern provides detailed information about the crystal structure, phase composition, lattice parameters, and crystallite size. For thin films, XRD is particularly valuable for identifying phases (e.g., crystalline or amorphous), determining preferred orientations, and assessing residual stresses, which are critical for understanding material properties and performance in applications like coatings or electronics.

In my project, I employed XRD to perform structural analysis of high entropy alloy (HEA) thin films, specifically CrMoNbTaW and AlCrFeCoNi, deposited via DC magnetron co-sputtering. Using XRD, I investigated the phase composition and crystallographic characteristics of these films to understand how their unique multi-element compositions influence their structure and properties. For CrMoNbTaW, XRD revealed the presence of a body-centered cubic (BCC) phase, with some samples showing a mix of crystalline and amorphous regions depending on deposition conditions. Similarly, for AlCrFeCoNi, XRD helped identify a face-centered cubic (FCC) or BCC structure, providing insights into phase stability and texture. These results were crucial for correlating the films’ microstructure with their mechanical and thermal properties, advancing their potential for high-performance applications in extreme environments.